Produktinformationen "Metrology and Standardization for Nanotechnology"
For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
| ISBN: | 9783527340392 |
|---|---|
| Verlag: | Wiley-VCH |
| Auflage: | 1 |
| Sprache: | Englisch |
| Seitenzahl: | 626 |
| Produktart: | Gebunden |
| Herausgeber: | Fujita, Daisuke Kaiser, Debra L. Mansfield, Elisabeth Van de Voorde, Marcel |
| Erscheinungsdatum: | 08.02.2017 |
| Verlag: | Wiley-VCH |
| Untertitel: | Protocols and Industrial Innovations |
| Schlagworte: | Analytical Chemistry Analytische Chemie Chemie Chemistry Electrical & Electronics Engineering Elektrotechnik u. Elektronik Materials Characterization Materials Science Materialwissenschaften Metrologie |