Reliability of Nanoscale Circuits and Systems
Produktinformationen "Reliability of Nanoscale Circuits and Systems"
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
| Autor: | Leblebici, Yusuf Schmid, Alexandre Stanisavljevic, Miloš |
|---|---|
| ISBN: | 9781441962164 |
| Verlag: | Springer US |
| Auflage: | 1 |
| Sprache: | Englisch |
| Seitenzahl: | 195 |
| Produktart: | Gebunden |
| Erscheinungsdatum: | 21.10.2010 |
| Verlag: | Springer US |
| Untertitel: | Methodologies and Circuit Architectures |
| Schlagworte: | Averaging Design Implementations Fault-Tolerant Approaches Fault-Tolerant Architectures Fault Models Faults Nanodevices Nanotechnology Reliability Reliability Evaluation Techniques Statistical Evaluation of Fault-Tolerance Using Probability |
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