Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
Produktinformationen "Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space"
Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
| Autor: | Niknahad, Mahtab |
|---|---|
| ISBN: | 9783731500384 |
| Verlag: | KIT Scientific Publishing |
| Sprache: | Englisch |
| Seitenzahl: | 160 |
| Produktart: | Kartoniert / Broschiert |
| Erscheinungsdatum: | 18.07.2013 |
| Verlag: | KIT Scientific Publishing |
| Schlagworte: | FPGA High reliability Redundancy Single Event Upset Space |